ELEG309 ELECTRONIC CIRCUIT ANALYSIS I
Instructor: Olufemi Olowolafe, 213 Evans Hall; e-mail: olowolaf@ece.udel.edu
Telephone: 302-831-4272
Course Website: www.eecis.udel.edu/~olowolaf/eleg309
Office hours: T&TR,
11-12 am
Class Schedule: T&TR,
9:30AM-10:45 AM; Location: Kirkbride 205
Purpose
The
class covers introductory topics in analog electronics. Together with ELEG312
it is the foundation for integrated analog circuit analysis and synthesis. The
main goal is to present the students to the fundamental semiconductor
components, in particular diodes and transistors, appropriate modeling and
analysis techniques as well as basic analog circuit configurations and
applications. At the end of the class, the student should be able to model,
analyze and, to a certain level, synthesize circuits containing a few
transistors.
General Contents
During
the first part of the semester we will review, briefly, fundamentals of
electric circuits, followed by a more detailed study of diodes from the system
level perspective without entering into the domain of solid-state electronics.
The second part of the course is devoted to the study of single and two-stage
amplifiers using bipolar and CMOS transistors.
Prerequisites
Basic
Calculus; ELEG205: circuit analysis techniques (KVL and KCL, superposition,
circuit transformation, Thevenin and Norton
equivalents), some of which we will review here; good level of algebra (always
nice!)
Class Requirements
Three
mid-semester tests, biweekly
homework, weekly quizzes (easy), and illustrative lab experiments constitute
the workload for the class. No final exam.
The
tests and quizzes are individual and closed book. The instructor will provide a help sheet for midterm tests and NO
additional material is allowed during exams or quizzes, except for calculators
when necessary. Any requests for make-up tests (midterm or final) will be subjected
to university policy. No normalization (curving) will be applied to partial
grades (quizzes, homework, labs or tests); only final grades will be normalized
according to statistical distribution of data.
Theoretical
homework and lab experiments are in
groups of two people (you can work alone for the homework if you will, but the
lab sessions have to be in couples). Only one homework submission per group is
necessary and it is due at 5PM on the submission date (see schedule next page).
Homework that is not submitted on the due date by 5PM will not be accepted, and
will be assigned a grade of zero.
Quizzes
are an easy and fast way to keep you focused on the subjects presented in class
and covered in the homework exercises. I urge you to devote time to homework
and quizzes and come back to class or office hours (TA’s or instructor’s) to
clear your doubts A good,
well-distributed dedication to such simple matters will ease your way to the
tests and guarantee satisfactory final grades. Quizzes and homework solutions,
as well as test solutions will be posted shortly after their submission date
(see schedule next page).
The
worst personal quiz of the semester will not be taken into account in the grade
computation. In addition, you have the possibility of one and only one “make
up” quiz within one week of the original quiz date with no academic penalty.
Any other quizzes missed during the semester will count as zero.
Attendance
to lab sessions is mandatory and except for proven medical
conditions the lab practices are not to be rescheduled or reprogrammed.
Important
Note
Any
evidence of copied lab reports, homework or dishonesty during tests and quizzes
will result in an academic dishonesty report in your record and the
corresponding academic penalty. NO EXCEPTIONS.
The grade
distribution is as follows:
3 Mid-term tests 45%
Quizzes 25%
Homework 15%
Lab 15%
Textbook: Sedra,
A. , Smith, K., “Microelectronic Circuits”, Oxford
University Press, 5th edition.
Lab book
(optional): Berlin,
H., “Experiments in Electronic Devives”, Prentice
Hall, 6th edition.
Other references: Class notes from instructor and
chapters from other textbooks.
CLASS TOPICS
Chapter
1: Fundamentals of Electric Circuits: A review
Basic definitions; Fundamental
laws of circuit analysis(KCL & KVL); Electric Power & Sign
Convention; Circuit Elements; Basic Analysis Techniques (Voltage
and Current Dividers); Some Applications; Lab Measuring Devices.
Chapter 2: Diodes
2.1
The ideal diode
2.2
Analysis of diode circuits, ON/OFF states, Simple circuits
2.3
Physical operation of diodes
2.4
IV characteristics of junction diodes
2.5
The small signal model and its applications
2.6
Zener diodes
2.7
Applications of Diodes: regulation, Clamping, clipping
Chapter 3: Bipolar
Junction Transistors (BJTs)
3.1
Intuitive approach to the BJT operation
3.2
IV characteristics-operation modes
3.3
The transistor as an amplifier-DC analysis (biasing)
3.4
The transistor as an amplifier-AC analysis (small signal modeling)
3.5
Single stage configurations: Common Emitter configuration
3.6
Single stage configurations: Common Collector & Common Base
3.7
Introduction to high-frequency small signal modeling of BJTs
Chapter 4: Field
Effect Transistors (FETs)
4.1
Intuitive approach to the MOSFET operation
4.2
I-V characteristics-operation modes
4.3
DC & AC analysis of MOSFETs
4.4
Single Stage configurations: Common source
4.5Single
stage configurations: Common Gate & Drain
4.6
Biasing in integrated circuits
4.7
The MOSFET high frequency small signal model
QUIZ TOPICS HOMEWORK TOPICS
·
Review 1.
Reviews & Topics 2.1-3.3
·
Topic
2.1 2.
Topics 2.4-2.7
·
Topics
2.2 & 2.3 3.
Topics 3.1-3.3
·
Topics
2.4 & 2.5 4.
Topics 3.4-3.7
·
Topics
3.1-3.3 5.
Topics 4.1-4.3
·
Topics
3.4 & 3.5 6. Topics
4.4-4.7
·
Topics
3.6, 3.7 & 4.1
·
Topics
4.2 & 4.3
·
Topic 4.4
·
Topics
4.5 & 4.6
LAB
SESSIONS-Actual
experiment sheets are in the lab book (optional to buy) or will be distributed the day of the lab
session
Lab1. Exp1. The diode. Lab5. Exp10. Transistor emitter biasing
Exp2. Diode Rectifier circuits Exp11. Transistor
voltage-divider biasing
Lab2.
Exp3. The capacitor input rect. filter Lab6. Exp13.
The common-emitter amplifier
Exp7. The Zener diode and voltage reg. Exp14. The common-collector amplifier
Lab3. Exp4. The diode limiter. Lab7. Exp15. The common-emitter/emitter follower
Exp5. The diode
clamper. Exp16.
The common-base amplifier
Lab4. Exp8. Testing transistor
diode juncts. Lab9. Exp22. The common-source amplifier
Exp9. Transistor
base biasing. Exp23.
The common-drain amplifier
CHRONOLOGICAL TABLE FOR WORK LOAD AND COURSE
MATERIAL DISTRIBUTION
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Sept |
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Octo |
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Nov |
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Dec |
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Date |
4 |
9,11 |
16,18 |
23,25 |
30 |
2 |
7,9 |
14,16 |
21,23 |
6 |
11,13 |
18,20 |
25 |
2,4 |
09 |
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Week |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
11 |
12 |
13 |
14 |
15 |
16 |
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Topic |
1 |
1,
2.2-2.3 |
1,
2.4-2.5 |
2.5 |
2.6-2.7 |
3.1-M1 |
3.1-3.3 |
3.4-3.5 |
3.6-3.7 |
M2 |
4.1 |
4.2-4.3 |
4.4 |
4.5-4.6 |
4.7,M3 |
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Labs |
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1 |
2 |
3 |
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4 |
5 |
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6 |
7 |
8 |
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HW due |
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1 |
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2 |
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3 |
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4 |
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5 |
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6 |
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Quiz |
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1 |
2 |
3 |
4 |
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5 |
6 |
7 |
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8 |
9 |
10 |
11 |
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